Semiconductor Malfunction Tester : DigInfo

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DigInfo - http://movie.diginfo.tv Hanwa Electronic Ind. has developed the HIT-5000, an immunity tester that tests semiconductors for immunity to noise using the impulse method. The pulse signal generator inside the tester generates a pulse signal that induces noise on the semiconductor. Probing can be easily conducted because the tester can be connected through a connector, and thus the tester is ideal for device tests. It also enables timing analysis. Normally, when an impulse is applied with an electrostatic discharge (ESD) gun, the power supply voltage noise that appears on the LSI pins may at times form an oscillating waveform even when the impulse is applied with a positive discharge. Particularly in cases where the malfunction threshold values in the positive and negative directions differ, it is possible that malfunction could occur due to values that exceed the negative direction threshold even if a positive discharge is applied. The HIT-5000 however offers greater versatility because it can separately evaluate either the positive or negative direction when a square pulse wave is input.

Category: Tech
Uploaded: February 21st, 2008 @ 10:56 am
Author: Diginfonews

Length: 01:59
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Views: 466

Tags: diginfo electronic electrotest hanwa hit-5000 industry malfunction semiconductor tester

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